Hikam, M., Department of Physics, FMIPA UI, UI Campus Depok, Indonesia – 17000, Indonesia

• Vol 35, No 1 (2009): January 2009 - Articles
  Surface Roughness and Grain Size Characterization of Annealing Temperature Effect For Growth Gallium and Tantalum Doped Ba_0.5 Sr_0.5TiO₃Thin Film
  Abstract  PDF