Hikam, M., Department of Physics, FMIPA UI, UI Campus Depok, Indonesia – 17000, Indonesia
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Vol 35, No 1 (2009): January 2009 - Articles
Surface Roughness and Grain Size Characterization of Annealing Temperature Effect For Growth Gallium and Tantalum Doped Ba0.5 Sr0.5TiO3Thin Film
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